• DocumentCode
    3718586
  • Title

    SEE Test Results of 256k RAM with Preliminary TID Irradiation

  • Author

    Vasily S. Anashin;Pavel A. Chubunov;Sergey A. Iakovlev

  • Author_Institution
    Inst. of Space Device Eng., Branch of JSC United Rocket &
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    this paper presents SEE test results of 256k RAM with preliminary γ-ray irradiation and comparison with previous not irradiated samples tests. Difference between irradiated and not irradiated samples test results for SEL is shown.
  • Keywords
    "Integrated circuits","Radiation effects","Silicon","Random access memory","Single event upsets","Testing"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365662
  • Filename
    7365662
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718586