• DocumentCode
    3718594
  • Title

    Statistical Anomalies of Bitflips in SRAMs to Discriminate MCUs from SEUs

  • Author

    Juan Antonio Clemente;Francisco J. Franco;Francesca Villa;Maud Baylac;Solenne Rey;Hortensia Mecha;Juan A. Agapito;Helmut Puchner;Guillaume Hubert;Raoul Velazco

  • Author_Institution
    Comput. Archit. Dept., Univ. Complutense de Madrid, Madrid, Spain
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presentes an approach to discern MCUs from SEUs in SRAM memories. Experiments involving radiation tests with 14-MeV neutrons on two successive generations (130 and 90 nm) of Cypress devices are presented.
  • Keywords
    "Neutrons","Electronic mail","Random access memory","Computer architecture","Microprocessors","Radiation effects","Single event upsets"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365670
  • Filename
    7365670
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718594