• DocumentCode
    3718597
  • Title

    The Critical Elements of the Modern Transceiver ICs upon Space Radiation Exposure

  • Author

    G. G. Davydov;A. S. Kolosova;D. V. Boychenko;A. A. Pechenkin

  • Author_Institution
    Moscow Eng. Phys. Inst., Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    As a result of analyzing more than 60 types of the modern transceivers ICs, the most sensitive functional units and the critical operation modes upon exposure the space radiation (especifically, TID and SEE effects) were identified.
  • Keywords
    "Transceivers","Receivers","Integrated circuits","Optical transmitters","Single event upsets","Crystals","Degradation"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365673
  • Filename
    7365673