DocumentCode
3718597
Title
The Critical Elements of the Modern Transceiver ICs upon Space Radiation Exposure
Author
G. G. Davydov;A. S. Kolosova;D. V. Boychenko;A. A. Pechenkin
Author_Institution
Moscow Eng. Phys. Inst., Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
fYear
2015
Firstpage
1
Lastpage
4
Abstract
As a result of analyzing more than 60 types of the modern transceivers ICs, the most sensitive functional units and the critical operation modes upon exposure the space radiation (especifically, TID and SEE effects) were identified.
Keywords
"Transceivers","Receivers","Integrated circuits","Optical transmitters","Single event upsets","Crystals","Degradation"
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN
978-1-5090-0232-0
Type
conf
DOI
10.1109/RADECS.2015.7365673
Filename
7365673
Link To Document