• DocumentCode
    3718602
  • Title

    The Impact of Plane-Polarized Unfocused Laser Radiation on Bulk Ionization in Deep-Submicron Modern ICs

  • Author

    P. K. Skorobogatov;G. G. Davydov;A. V. Sogoyan;A. Y. Nikiforov;A. N. Egorov

  • Author_Institution
    Moscow Eng. Phys. Inst., Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Manifestation of the dose rate effects is strongly depends on the laser polarization direction for the ICs, which technology is less than the laser wavelength. There are several approaches to reduce this influence in deep-submicron ICs.
  • Keywords
    "Integrated circuit modeling","Ionization","Radiation effects","Microelectronics","CMOS integrated circuits","Testing"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365678
  • Filename
    7365678
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718602