• DocumentCode
    3718606
  • Title

    The Technique for Estimation of the Chip Temperature of Integrated Circuits during Irradiation

  • Author

    Vladislav A. Felitsyn;Alexander S. Bakerenkov;Viacheslav S. Pershenkov;Alexander S. Rodin;Vladimir V. Belyakov;Vladimir V. Shurenkov;Nikita S. Glukhov

  • Author_Institution
    Nat. Res. Nucl. Univ. MEPhI (Moscow Eng. Phys. Inst.), Moscow, Russia
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The technique for estimation of the chip temperature of integrated circuits during irradiation is described. The technique is based on the experimental determination of the actual value of junction-to-ambient thermal resistance.
  • Keywords
    "Temperature measurement","Integrated circuits","Thermal resistance","Radiation effects","Temperature dependence","Semiconductor device measurement"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365682
  • Filename
    7365682
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718606