• DocumentCode
    3718608
  • Title

    TID and SEGR Radiation Characterisation of European COTS Power MOSFETs with Respect to Space Application Electronics

  • Author

    Michael Wind;Jayasimha V. Bagalkote;Peter Beck;Marcin Latocha;Marc Poizat

  • Author_Institution
    Seibersdorf Labs., Seibersdorf, Austria
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    We investigated TID radiation response and SEGR susceptibility of two COTS power MOSFETs by exposing them to Co-60 photons with 100 krad(Si) and various heavy ion fields of LET between 18.5 and 60 MeV mg-1cm-2.
  • Keywords
    "MOSFET","Europe","Logic gates","Laboratories","Semiconductor optical amplifiers","Photonics"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365684
  • Filename
    7365684
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718608