DocumentCode :
3718892
Title :
A study on the properties of complementary frequency selective surfaces for permittivity measurements
Author :
Chinwe C. Njoku
Author_Institution :
School of Electronic, Electrical & Systems Engineering, Loughborough University, Loughborough, LE11 3TU, UK
fYear :
2015
Firstpage :
1
Lastpage :
4
Abstract :
This paper presents parametric studies on the geometric and electromagnetic (EM) properties of complementary frequency selective surfaces (CFSS), used in an X-band waveguide for measuring the permittivities of dielectric substrates. This gives understanding of the optimum configuration to be used for the dielectric measurements. The studies were done via simulations using 3D finite-difference timedomain (FDTD) EM software, Empire XPU™ and the results are summarized in this paper.
Keywords :
"Resonant frequency","Dielectrics","Permittivity measurement","Frequency selective surfaces","Q-factor","Electromagnetic waveguides"
Publisher :
ieee
Conference_Titel :
Antennas & Propagation Conference (LAPC), 2015 Loughborough
Type :
conf
DOI :
10.1109/LAPC.2015.7365990
Filename :
7365990
Link To Document :
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