DocumentCode
37200
Title
Exhaustive Linearization for Robust Camera Pose and Focal Length Estimation
Author
Penate-Sanchez, A. ; Andrade-Cetto, Juan ; Moreno-Noguer, Francesc
Author_Institution
Inst. de Roboticai Inf. Ind., UPC, Barcelona, Spain
Volume
35
Issue
10
fYear
2013
fDate
Oct. 2013
Firstpage
2387
Lastpage
2400
Abstract
We propose a novel approach for the estimation of the pose and focal length of a camera from a set of 3D-to-2D point correspondences. Our method compares favorably to competing approaches in that it is both more accurate than existing closed form solutions, as well as faster and also more accurate than iterative ones. Our approach is inspired on the EPnP algorithm, a recent O(n) solution for the calibrated case. Yet we show that considering the focal length as an additional unknown renders the linearization and relinearization techniques of the original approach no longer valid, especially with large amounts of noise. We present new methodologies to circumvent this limitation termed exhaustive linearization and exhaustive relinearization which perform a systematic exploration of the solution space in closed form. The method is evaluated on both real and synthetic data, and our results show that besides producing precise focal length estimation, the retrieved camera pose is almost as accurate as the one computed using the EPnP, which assumes a calibrated camera.
Keywords
calibration; cameras; linearisation techniques; pose estimation; 3D-to-2D point correspondences; O(n) solution; camera calibration; exhaustive linearization; exhaustive relinearization; focal length estimation; robust camera pose estimation; systematic solution space exploration; Cameras; Equations; Estimation; Kernel; Linear systems; Noise; Vectors; Camera calibration; perspective-n-point problem; Algorithms; Artificial Intelligence; Computer Simulation; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Linear Models; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.2013.36
Filename
6425380
Link To Document