Title :
Switching and robustness analysis of 10 kV SiC BJTs
Author :
Ranbir Singh;Stoyan Jeliazkov;Brian Grummel;Siddarth Sundaresan
Author_Institution :
GeneSiC Semiconductor, Inc., 43670 Trade Center Pl, Suite 155, Dulles, VA 20166, USA
Abstract :
Collector-Emiter blocking voltages of 10.5 kV (91% of theoretical avalanche limit and 125 V/μm), on-resistance of 110 mΩ-cm2, which is close to the unipolar limit of 94 mΩ-cm2, and current gain as high as 75 are measured on 10 kV SiC BJTs. Monolithic Darlington-connected BJTs fabricated on the same wafer yield current gains as high as 3400, and show Si BJT-like output characteristics in the saturation region and a distinct quasi-saturation region. Switching measurements performed at a DC link voltage of 5 kV and collector current of 8 A feature a collector current rise time as low as 30 ns during turn-on and collector voltage recovery time as low as 100 ns during turn-off. Very low turn-on and turn-off switching energies of 4.2 mJ and 1.6 mJ, respectively, are extracted from the switching transients, which are 19 and 25 times smaller than the corresponding switching energies reported on 6.5 kV Si IGBTs. When turned-on to a short-circuited load at a collector bias of 4500 V, the 10 kV BJT shows a temperature-invariant, withstand time in excess of 20 μs. Leakage currents <; 1μA (system limit) are measured, even after 234 hours of operation under a DC collector bias of 5000 V at elevated temperatures.
Keywords :
"Decision support systems","Circuit stability","Leakage currents","DVD"
Conference_Titel :
Wide Bandgap Power Devices and Applications (WiPDA), 2015 IEEE 3rd Workshop on
DOI :
10.1109/WiPDA.2015.7369317