• DocumentCode
    3721103
  • Title

    Evaluation and applications of 600V/650V enhancement-mode GaN devices

  • Author

    Xiucheng Huang;Tao Liu;Bin Li;Fred C. Lee;Qiang Li

  • Author_Institution
    Center for Power Electronics Systems, Virginia Tech Blacksburg, VA, USA
  • fYear
    2015
  • Firstpage
    113
  • Lastpage
    118
  • Abstract
    This paper presents elaborate evaluation of 600V/650V enhancement mode gallium nitride (GaN) devices. The switching loss mechanism and the impact of package and driving circuit parameters are illustrated in detail. The hard-switching turn-on loss is dominant due to junction capacitor charge of the freewheeling switch. The turn-off loss is much smaller and it can be further improved by driving circuit parameters and packaging. The driving circuit taking consider of high dv/dt and di/dt immunity is discussed. A few design examples are shown to demonstrate the advantage of GaN and the impact of GaN on system design.
  • Keywords
    "Gallium nitride","Logic gates","Inductance","Switching loss","Switches","Silicon","MOSFET"
  • Publisher
    ieee
  • Conference_Titel
    Wide Bandgap Power Devices and Applications (WiPDA), 2015 IEEE 3rd Workshop on
  • Type

    conf

  • DOI
    10.1109/WiPDA.2015.7369318
  • Filename
    7369318