DocumentCode
3721103
Title
Evaluation and applications of 600V/650V enhancement-mode GaN devices
Author
Xiucheng Huang;Tao Liu;Bin Li;Fred C. Lee;Qiang Li
Author_Institution
Center for Power Electronics Systems, Virginia Tech Blacksburg, VA, USA
fYear
2015
Firstpage
113
Lastpage
118
Abstract
This paper presents elaborate evaluation of 600V/650V enhancement mode gallium nitride (GaN) devices. The switching loss mechanism and the impact of package and driving circuit parameters are illustrated in detail. The hard-switching turn-on loss is dominant due to junction capacitor charge of the freewheeling switch. The turn-off loss is much smaller and it can be further improved by driving circuit parameters and packaging. The driving circuit taking consider of high dv/dt and di/dt immunity is discussed. A few design examples are shown to demonstrate the advantage of GaN and the impact of GaN on system design.
Keywords
"Gallium nitride","Logic gates","Inductance","Switching loss","Switches","Silicon","MOSFET"
Publisher
ieee
Conference_Titel
Wide Bandgap Power Devices and Applications (WiPDA), 2015 IEEE 3rd Workshop on
Type
conf
DOI
10.1109/WiPDA.2015.7369318
Filename
7369318
Link To Document