DocumentCode :
3721103
Title :
Evaluation and applications of 600V/650V enhancement-mode GaN devices
Author :
Xiucheng Huang;Tao Liu;Bin Li;Fred C. Lee;Qiang Li
Author_Institution :
Center for Power Electronics Systems, Virginia Tech Blacksburg, VA, USA
fYear :
2015
Firstpage :
113
Lastpage :
118
Abstract :
This paper presents elaborate evaluation of 600V/650V enhancement mode gallium nitride (GaN) devices. The switching loss mechanism and the impact of package and driving circuit parameters are illustrated in detail. The hard-switching turn-on loss is dominant due to junction capacitor charge of the freewheeling switch. The turn-off loss is much smaller and it can be further improved by driving circuit parameters and packaging. The driving circuit taking consider of high dv/dt and di/dt immunity is discussed. A few design examples are shown to demonstrate the advantage of GaN and the impact of GaN on system design.
Keywords :
"Gallium nitride","Logic gates","Inductance","Switching loss","Switches","Silicon","MOSFET"
Publisher :
ieee
Conference_Titel :
Wide Bandgap Power Devices and Applications (WiPDA), 2015 IEEE 3rd Workshop on
Type :
conf
DOI :
10.1109/WiPDA.2015.7369318
Filename :
7369318
Link To Document :
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