DocumentCode :
3721110
Title :
A SiC 8 Bit DAC at 400?C
Author :
A. Rahman;S. Roy;R. C. Murphree;H. A. Mantooth;A. M. Francis;J. Holmes
Author_Institution :
Department of Electrical Engineering, University of Arkansas Fayetteville, AR 72701, USA
fYear :
2015
Firstpage :
241
Lastpage :
246
Abstract :
This paper presents the first operational digital to analog converter at 400°C. The 8 bit R-2R ladder DAC was designed in the Raytheon 1.2 μm CMOS HiTSiC process. The data converter is also the first of its kind in SiC. It has been tested with a supply voltage between 12 V and 15 V, and reference voltages of 5 V to 8 V. At 400°C, the maximum measured differential non linearity (DNL) is 2 LSB (least significant bit) and the integral non linearity is 4.4 LSB.
Keywords :
"Silicon carbide","Temperature measurement","Integrated circuits","Voltage measurement","Digital-analog conversion","Switches","Breakdown voltage"
Publisher :
ieee
Conference_Titel :
Wide Bandgap Power Devices and Applications (WiPDA), 2015 IEEE 3rd Workshop on
Type :
conf
DOI :
10.1109/WiPDA.2015.7369325
Filename :
7369325
Link To Document :
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