DocumentCode
3721241
Title
Meta learning of bounds on the Bayes classifier error
Author
Kevin R. Moon;Alfred O. Hero;B. V?ronique Delouille
Author_Institution
University of Michigan, Department of EECS, 1301 Beal Avenue, Ann Arbor, 48109, USA
fYear
2015
Firstpage
13
Lastpage
18
Abstract
Meta learning uses information from base learners (e.g. classifiers or estimators) as well as information about the learning problem to improve upon the performance of a single base learner. For example, the Bayes error rate of a given feature space, if known, can be used to aid in choosing a classifier, as well as in feature selection and model selection for the base classifiers and the meta classifier. Recent work in the field of f-divergence functional estimation has led to the development of simple and rapidly converging estimators that can be used to estimate various bounds on the Bayes error. We estimate multiple bounds on the Bayes error using an estimator that applies meta learning to slowly converging plug-in estimators to obtain the parametric convergence rate. We compare the estimated bounds empirically on simulated data and then estimate the tighter bounds on features extracted from an image patch analysis of sunspot continuum and magnetogram images.
Keywords
"Bit error rate","Estimation","Signal processing","Convergence","Conferences","Moon"
Publisher
ieee
Conference_Titel
Signal Processing and Signal Processing Education Workshop (SP/SPE), 2015 IEEE
Type
conf
DOI
10.1109/DSP-SPE.2015.7369520
Filename
7369520
Link To Document