Title :
Two effective anomaly correction methods in embedded systems
Author :
Roghayeh Mojarad;Hamid R. Zarandi
Author_Institution :
Department of Computer Engineering and Information Technology Amirkabir University of Technology (Tehran Polytechnic)
fDate :
10/1/2015 12:00:00 AM
Abstract :
In this paper, two anomaly correction methods are proposed which are based on Markov and Stide detection methods. Both methods consist of three steps: 1) Training, 2) Anomaly detection and 3) Anomaly Correction. In training step, the Morkov-based method constructs a transition matrix; Stidebased method makes a database by events with their frequency. In detection step, when the probability of transition from previous event to current event does not reach a predefined threshold, the morkov-based method detects an anomaly. While, if frequency of unmatched events exceeds from the threshold value, Stide-based method determined an anomaly. In the correction step, the methods check the defined constraints for each anomalous event to find source of anomaly and a suitable way to correct the anomalous event. Evaluation of the proposed methods are done using a total of 7000 data sets. The window size of corrector and the number of injected anomalies varied between 3 and 5, 1 and 7, respectively. The experiments have been done to measure the correction coverage rate for Markov-based and Stide-based methods which are on average 77.66% and 60.9%, respectively. Area consumptions in Makov-based and Stide-based methods are on average 415.48μm2 and 239.61μm2, respectively.
Keywords :
"Training","Sensors","Databases","Testing","Embedded systems","Training data","Markov processes"
Conference_Titel :
Real-Time and Embedded Systems and Technologies (RTEST), 2015 CSI Symposium on
DOI :
10.1109/RTEST.2015.7369849