DocumentCode :
3722177
Title :
Combining MDL and BIC to Build BNs for System Reliability Modeling
Author :
Xiaopin Zhong;Weizhen You
Author_Institution :
Shenzhen Key Lab. of Electromagn. Control, Shenzhen Univ., Shenzhen, China
fYear :
2015
Firstpage :
1
Lastpage :
4
Abstract :
Bayesian networks (BNs) is widely used for system reliability modeling because of its versatility. It is crucial to build BNs from reliability data without experts´ intervene. However, the BNs structure learning is still an open problem. Traditional approaches always integrate a structure scoring metric with a particular heuristically searching method. This usually overfits or underfits the data. In this paper, we propose a new method that combines the Minimal Description Length principle (MDL) and Bayesian Information Criterion (BIC) to partially overcome the weakness of traditional mothods. Simula-tions show that the proposed method can effectively reduce the overfitting and underfitting of the BN model, thus improving the accuracy of the reliability estimation results.
Keywords :
"Reliability","Bayes methods","Measurement","Estimation","Probabilistic logic","Simulation","Complexity theory"
Publisher :
ieee
Conference_Titel :
Information Science and Security (ICISS), 2015 2nd International Conference on
Type :
conf
DOI :
10.1109/ICISSEC.2015.7370987
Filename :
7370987
Link To Document :
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