Using a Modified Taylor Cell to Validate Simulation and Measurement of Field-to-Shorted-Trace Coupling

Predicting the immunity of electronic boards to radiated electromagnetic interference requires the computation of the coupling efficiency of an electromagnetic field to PCB traces. In the case of complex PCBs, full-wave electromagnetic solvers are convenient, yet at the expense of simulation time. Therefore, this paper introduces the extension of a modified Taylor-based analytical model to the case of traces terminated at one end by a noncharacteristic impedance. This model makes it possible to determine the far-field-to-trace coupling using only a sum of closed-form equations. When applied to a shorted, meandered PCB trace, it was found to be as precise as 2.2 dB average absolute error with respect to GTEM measurements, which demonstrates its relevance for immunity prediction. Moreover, the full-wave simulation of this case study was validated using the extended model and found to be as precise as 1.4 dB average absolute error.