• DocumentCode
    3723618
  • Title

    Analysis of the effect of the density of states on the characteristics of thin-film transistors

  • Author

    Miryeon Kim; Injae Lee; Hyungsoon Shin; Min-Ho Shin

  • Author_Institution
    Department of Electronics Engineering, Ewha Womans University, Seoul, Republic of Korea
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The effect of the density of states (DOS) on the electrical characteristics of thin-film transistors (TFTs) is investigated via an experiment and device simulations. The acceptor-like DOS of an n-type TFT was extracted based on its multi-frequency capacitance-voltage characteristics. The simulation results demonstrate that the electrical characteristics of n-type TFTs are affected not only by the acceptor-like DOS but also by the donor-like DOS.
  • Keywords
    Capacitance
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2015 - 2015 IEEE Region 10 Conference
  • ISSN
    2159-3442
  • Print_ISBN
    978-1-4799-8639-2
  • Electronic_ISBN
    2159-3450
  • Type

    conf

  • DOI
    10.1109/TENCON.2015.7372859
  • Filename
    7372859
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3723618