Title :
Far-field Measurement of single gold nanorod scattering using total-internal-reflection illumination
Author :
DongHyeong Kim;Kwang-Yong Jeong;Ho-Seok Ee;Hong-Gyu Park;Min-Kyo Seo
Author_Institution :
Department of Physics, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 305-701, Korea
Abstract :
We made a novel method for measuring far-field scattering distribution of single nanostructure with high signal-to-background ratio using total-internal-reflection illumination. We achieved wide measurement range by direct scanning over limit of numerical-aperture in conventional back-focal-imaging.
Keywords :
Integrated circuits
Conference_Titel :
Lasers and Electro-Optics Pacific Rim (CLEO-PR), 2015 11th Conference on
DOI :
10.1109/CLEOPR.2015.7375854
