Title :
Radiative and non-radiative carrier lifetimes in InGaN-based light-emitting diodes investigated by impedance analysis
Author :
Young-Jin Kim;Dong-Pyo Han;Gyeong Won Lee;Dong-Soo Shin;Jong-In Shim
Author_Institution :
Department of Electronics and Communication Engineering, Hanyang University, ERICA Campus, Ansan 426-791, Korea
Abstract :
To investigate the efficiency droop in InGaN-based light-emitting diodes, we have measured the differential carrier lifetimes using the electrical method. After separating the radiative and non-radiative carrier lifetimes using the internal quantum efficiency, we discuss their implications.
Keywords :
"Light emitting diodes","Radiative recombination","Charge carrier lifetime","Impedance","Current measurement","Impedance measurement","Temperature measurement"
Conference_Titel :
Lasers and Electro-Optics Pacific Rim (CLEO-PR), 2015 11th Conference on
DOI :
10.1109/CLEOPR.2015.7375898
