DocumentCode :
3726083
Title :
Low-frequency noise characteristics of InGaN-based light-emitting diodes
Author :
Chan-Hyoung Oh;Dong-Pyo Han;Dong-Soo Shin;Jong-In Shim
Author_Institution :
Department of Electronics and Communication Engineering, Hanyang University, ERICA Campus, Ansan, Gyeonggi-do, 426-791, Korea
Volume :
2
fYear :
2015
Firstpage :
1
Lastpage :
2
Abstract :
We investigate the low-frequency noise characteristics of InGaN-based light-emitting diodes with different forward leakage currents. It is found that the low-frequency noise characteristics are closely correlated with the forward leakage current.
Keywords :
"Low-frequency noise","Light emitting diodes","Leakage currents","Reliability","Density measurement","Current measurement","Measurement by laser beam"
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Pacific Rim (CLEO-PR), 2015 11th Conference on
Type :
conf
DOI :
10.1109/CLEOPR.2015.7376075
Filename :
7376075
Link To Document :
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