DocumentCode
3726083
Title
Low-frequency noise characteristics of InGaN-based light-emitting diodes
Author
Chan-Hyoung Oh;Dong-Pyo Han;Dong-Soo Shin;Jong-In Shim
Author_Institution
Department of Electronics and Communication Engineering, Hanyang University, ERICA Campus, Ansan, Gyeonggi-do, 426-791, Korea
Volume
2
fYear
2015
Firstpage
1
Lastpage
2
Abstract
We investigate the low-frequency noise characteristics of InGaN-based light-emitting diodes with different forward leakage currents. It is found that the low-frequency noise characteristics are closely correlated with the forward leakage current.
Keywords
"Low-frequency noise","Light emitting diodes","Leakage currents","Reliability","Density measurement","Current measurement","Measurement by laser beam"
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Pacific Rim (CLEO-PR), 2015 11th Conference on
Type
conf
DOI
10.1109/CLEOPR.2015.7376075
Filename
7376075
Link To Document