• DocumentCode
    3726299
  • Title

    High precision prediction of thin film composition by LIBS

  • Author

    Jung Hwan In;Chan Kyu Kim Seok Hee Lee;Sungho Jeong

  • Author_Institution
    School of Mechatronics, Gwangju Institute of Science and Technology 1 Oryong-dong Buk-gu, Gwangju 500-712, Republic of Korea
  • Volume
    3
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The measurement of average composition or spatial elemental distribution in thin films of a few micrometer thickness is important for product evaluation or process monitoring in thin film product industry. This work reports that the average composition of thin solar cell films (~ 2 mm) could be predicted with high precision (<; 1% relative standard deviation) by laser induced breakdown spectroscopy (LIBS). The depthwise distribution of constituent elements could also be measured with a spatial resolution below 100 nm as was confirmed with secondary ion mass spectrometry. It is discussed that the high precision of LIBS with its intrinsic rapid, no sample preparation, in-air measurement capability provides a powerful technique for composition monitoring at manufacturing sites.
  • Keywords
    "Films","Photovoltaic cells","Spectroscopy","Monitoring","Electric breakdown","Plasmas","Logic gates"
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Pacific Rim (CLEO-PR), 2015 11th Conference on
  • Type

    conf

  • DOI
    10.1109/CLEOPR.2015.7376416
  • Filename
    7376416