Title :
Optical detection of micro defect by single-pixel imaging
Author :
K. Shibuya;Y. Mizutani;H. Yamamoto;T. Yasui;T. Iwata
Author_Institution :
Graduate School of Advanced Technology and Science, The Tokushima University, 2-1 Minami-Josanjima-cho, Tokushima, Japan
Abstract :
We propose an optical detection method of micro defect by single-pixel imaging microscopy. Our results demonstrate the micro defect imaging by detecting an anisotropic scattered light on mirror surface.
Keywords :
"Optical imaging","Optical scattering","Optical sensors","Image reconstruction","High-speed optical techniques","Geometrical optics"
Conference_Titel :
Lasers and Electro-Optics Pacific Rim (CLEO-PR), 2015 11th Conference on
DOI :
10.1109/CLEOPR.2015.7376458
