• DocumentCode
    3726671
  • Title

    Inferring Feature Relevances From Metric Learning

  • Author

    Alexander Schulz;Bassam Mokbel;Michael Biehl;Barbara Hammer

  • Author_Institution
    CITEC Centre of Excellence, Bielefeld Univ., Bielefeld, Germany
  • fYear
    2015
  • Firstpage
    1599
  • Lastpage
    1606
  • Abstract
    Powerful metric learning algorithms have been proposed in the last years which do not only greatly enhance the accuracy of distance-based classifiers and nearest neighbor database retrieval, but which also enable the interpretability of these operations by assigning explicit relevance weights to the single data components. Starting with the work [1], it has been noticed, however, that this procedure has very limited validity in the important case of high data dimensionality or high feature correlations: the resulting relevance profiles are random to a large extend, leading to invalid interpretation and fluctuations of its accuracy for novel data. While the work [1] proposes a first cure by means of L2-regularisation, it only preserves strongly relevant features, leaving weakly relevant and not necessarily unique features undetected. In this contribution, we enhance the technique by an efficient linear programming scheme which enables the unique identification of a relevance interval for every observed feature, this way identifying both, strongly and weakly relevant features for a given metric.
  • Keywords
    "Measurement","Eigenvalues and eigenfunctions","Prototypes","Covariance matrices","Correlation","Feature extraction","Electronic mail"
  • Publisher
    ieee
  • Conference_Titel
    Computational Intelligence, 2015 IEEE Symposium Series on
  • Print_ISBN
    978-1-4799-7560-0
  • Type

    conf

  • DOI
    10.1109/SSCI.2015.225
  • Filename
    7376801