DocumentCode :
3726844
Title :
Cloth pattern recognition with four features (RSSM)
Author :
N Durga Rao;G Sudhavani;P Balakrishna;K Gouthami
Author_Institution :
Vignan´s Nirula Institute of Technology and Science for Women, Guntur, Andhra Pradesh, India
fYear :
2015
Firstpage :
53
Lastpage :
59
Abstract :
Automatic clothing pattern recognition is a challenging research problem due to rotation, scaling, illumination, and especially large intra-class pattern variations. This paper recognizes clothing patterns in four categories (plaid, striped, pattern-less, and irregular) and identifies clothing colors. To recognize clothing patterns, we propose a novel Radon Transform Descriptor (RTD), Scale Invariant Feature Transform (SIFT), Mathematical Morphology (MM) based global feature and a schema to extract Statistical Descriptor (STA) to capture global features of clothing patterns. They all are combined to recognize complex clothing patterns. Our approach achieves 96% recognition accuracy which significantly outperforms the state-of-the-art texture analysis methods on clothing pattern recognition.
Keywords :
"Image recognition","Clothing","Discrete wavelet transforms","Visualization","Image resolution","Image color analysis","Geometry"
Publisher :
ieee
Conference_Titel :
Advanced Computing and Communication (ISACC), 2015 International Symposium on
Print_ISBN :
978-1-4673-6707-3
Type :
conf
DOI :
10.1109/ISACC.2015.7377315
Filename :
7377315
Link To Document :
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