DocumentCode :
37271
Title :
Strain Dependence of Critical Fields—Studied on Piezoelectric Substrates
Author :
Trommler, Sascha ; Molatta, Sebastian ; Hanisch, Jens ; Iida, Kazumasa ; Schultz, Ludwig ; Huhne, Ruben
Volume :
25
Issue :
3
fYear :
2015
fDate :
Jun-15
Firstpage :
1
Lastpage :
4
Abstract :
\\hbox {La}_{{\\ker n-.5pt}1{\\ker n-.5pt}.{\\ker n-.5pt}85}{\\ker n-.5pt}\\hbox {Sr}_{{\\ker n-.5pt} 0{\\ker n-.5pt}.{\\ker n-.5pt}15}{\\ker n-.5pt}\\hbox {CuO}_{{\\ker n-.5pt}4} , \\hbox {BaFe}_{{\\ker n-.5pt}1{\\ker n-.5pt}.{\\ker n-.5pt}8}{\\ker n-.5pt}\\hbox {Co}_{{\\ker n-.5pt} 0{\\ker n-.5pt}.{\\ker n-.5pt}2}{\\ker n-.5pt}\\hbox {As}_{{\\ker n-.5pt}2} and \\hbox {FeSe}_{{\\ker n-.5pt}0{\\ker n-.5pt}.{\\ker n-.5pt}5}{\\ker n-.5pt}\\hbox {Te}_{{\\ker n-.5pt}0.5} thin films have been prepared on piezoelectric (001) \\hbox {Pb}(\\hbox {Mg}_{1/3}\\hbox {Nb}_{2/3})_{0.72}\\hbox {Ti}_{0.28}\\hbox {O}_{3} substrates. By the use of the inverse piezoelectric effect, biaxial strain was induced into the films by applying an electric field to the sample. The strain sensitivity of the upper critical field and of the irreversibility line was determined by the analysis of the resistive transition. A biaxial compression in the order of 0.02% results in a shift of these fields. A consistent description of the field dependence is possible taking into account a strain dependent transition temperature. No influence of the strain state on the anisotropy of the upper critical field was found in first approximation.
Keywords :
Epitaxial growth; Strain; Substrates; Superconducting transition temperature; Temperature dependence; Temperature measurement; Critical fields; Fe-based superconductors; critical fields; cuprates; strain;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2014.2369733
Filename :
6954390
Link To Document :
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