DocumentCode :
3727352
Title :
On-chip and on-board RF noise coupling and impacts on LTE wireless communication performance (Invited)
Author :
Makoto Nagata;Noriyuki Miura;Sho Muroga;Satoshi Tanaka;Masahiro Yamaguchi
Author_Institution :
Kobe University, Kobe, Japan
fYear :
2015
Firstpage :
7
Lastpage :
9
Abstract :
In-band interferers due to noise coupling from baseband digital circuits significantly impact on the wireless communication performance, in the case of single-chip system-level integration. The on-chip and off-chip (on-board) noise coupling are measured for visualizing the noise couplings. In addition, the hardware-in-the-loop simulation (HILS) estimates their impacts on the performance metrics like throughputs, under the interactions of interferers with the operation of LTE-compliant RF receiver circuits in a 65 nm CMOS technology.
Keywords :
"Radio frequency","Couplings","Wireless communication","Substrates","System-on-chip","Long Term Evolution","Noise measurement"
Publisher :
ieee
Conference_Titel :
Radio-Frequency Integration Technology (RFIT), 2015 IEEE International Symposium on
Type :
conf
DOI :
10.1109/RFIT.2015.7377869
Filename :
7377869
Link To Document :
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