DocumentCode
3728036
Title
An Optimal Diagnosis of NoC Interconnects on Activation of Diagonal Routers
Author
Biswajit Bhowmik;Santosh Biswas;Jatindra Kumar Deka
Author_Institution
Dept. of Comput. Sci. &
fYear
2015
Firstpage
755
Lastpage
760
Abstract
Previous works on detecting and locating manufacturing faults-shorts, stuck-at, and open on an interswitch link of a channel in a network-on-chip (NoC) have been based on the assumption that these faults do not coexist. The works failed to diagnose all these faults when this assumption is relaxed. A deficiency for non-diagnosability of these faults is then represented. A packet address driven test strategy that detects and locates a faulty inters witch link in a NoC channel is proposed. The strategy addresses the intra-channel shorts, stuck at, and open faults coexist on inters witch links and is governed by parallel activation of diagonal routers. The strategy is scalable with mesh NoCs. Simulation results achieve 100% and more than 97% fault coverages when faults are diagnosed explicitly and implicitly respectively.
Keywords
"Testing","Silicon","Payloads","Routing protocols","Topology","Manufacturing","Adaptive algorithms"
Publisher
ieee
Conference_Titel
Systems, Man, and Cybernetics (SMC), 2015 IEEE International Conference on
Type
conf
DOI
10.1109/SMC.2015.141
Filename
7379273
Link To Document