• DocumentCode
    3728752
  • Title

    Study of stability of DC power considering the degradation of MOSFET

  • Author

    Lifeng Wu; Yu Zheng; Yong Guan

  • Author_Institution
    College of Information Engineering, Capital Normal University, Beijing 100048, China
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    DC power is the core technology of various power electronic devices and the MOSFET is the key component to affect DC power. In order to research the degradation of MOSFET effect on DC power, we construct an equivalent circuit of MOSFET, and establish the discrete iterative mapping model of the system in continuous current mode. After verifying the impact of MOSFET parasitic on the stability of the system, we study the influence of parasitic parameters based on the nonlinear behavior. The results exhibit that the degradation of MOSFET results in the change of nonlinear behavior of output voltage and influences the stability of the system.
  • Keywords
    "MOSFET","Semiconductor device modeling"
  • Publisher
    ieee
  • Conference_Titel
    Prognostics and System Health Management Conference (PHM), 2015
  • Type

    conf

  • DOI
    10.1109/PHM.2015.7380024
  • Filename
    7380024