Title :
An extended testability modeling method based on the enable relationship between faults and tests
Author :
Yi Deng; Junyou Shi; Kan Liu
Author_Institution :
School of Reliability and Systems Engineering, Beihang University, Beijing, China
Abstract :
To improve the accuracy of testability modeling, the paper proposes an extended testability modeling method based on FTE (the enable relationship between faults and tests). The characteristics of FTE are analyzed, and corresponding mathematical definition is given. Besides, the graphic modeling method of the extended model of testability considering FTE is designed, and the acquisition method of the diagnosis matrixes considering FTE is also proposed. At last, using the traditional modeling method and an extended testability modeling method based on the enable relationship between faults and tests to model of the laser inertial navigation system.
Keywords :
"Mathematical model","Analytical models","Field programmable gate arrays","Frequency modulation","Navigation","Yttrium"
Conference_Titel :
Prognostics and System Health Management Conference (PHM), 2015
DOI :
10.1109/PHM.2015.7380032