DocumentCode :
3731712
Title :
Fast thermal analysis of TSV-based 3D-ICs by GMRES with symmetric successive over-relaxation (SSOR) preconditioning
Author :
Jianping Zhu;Yingying Liu;Wei Zhuang;Wanchun Tang
Author_Institution :
School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, China
fYear :
2015
Firstpage :
178
Lastpage :
181
Abstract :
Thermal issue is a leading design constraint for three-dimensional integrated circuits (3D-ICs) and through silicon vias (TSVs) are used to reduce the temperature of 3D-ICs effectively. In this paper, the finite difference method-based heat conduction equations is proposed for the thermal analysis of the TSV structures in 3D-ICs and generalized minimum residual method (GMRES) with symmetric successive over-relaxation (SSOR) preconditioning is utilized to solve the resulting temperature matrix equations. Simulation results show the accuracy and efficiency of the proposed method.
Keywords :
"Thermal analysis","Mathematical model","Through-silicon vias","Heating","Integrated circuit modeling","Silicon","Symmetric matrices"
Publisher :
ieee
Conference_Titel :
Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2015 IEEE
Type :
conf
DOI :
10.1109/EDAPS.2015.7383696
Filename :
7383696
Link To Document :
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