Title :
Advanced quality control at raw material kickoff stage
Author :
Xiaofeng Shui;Aoyu Shangguan;Yanju Yu;Hailin Gao
Author_Institution :
Department of Material Quality Engineering, Semiconductor Manufacturing International Corporation, Shanghai, China
Abstract :
The quality requirement for raw material is becoming more and stricter along with technical development of semiconductor industry. To meet the high technical requirement, effective quality control at raw material kickoff stage can remarkably reduce quality risk during manufacturing process. This paper will focus on the application of advanced quality control at raw material kickoff stage. The purpose is to reduce manufacturing risk by implementing the advanced quality control methodology at raw material kickoff stage and strictly following the defined requirements during mass production at both supplier plant and foundry.
Keywords :
"Raw materials","Quality control","Process control","Correlation","Inspection","Manufacturing processes"
Conference_Titel :
Industrial Engineering and Engineering Management (IEEM), 2015 IEEE International Conference on
DOI :
10.1109/IEEM.2015.7385788
