• DocumentCode
    3733050
  • Title

    Study on reliability assessment method for Step-down-stress accelerated life test based on Bayesian theory

  • Author

    Honghua Hu;Jun Yao;Jingyue Yang;Shuizhuang Miao;Shouzhen Wang

  • Author_Institution
    School of Reliability and Systems Engineering, Beihang University, Beijing, China
  • fYear
    2015
  • Firstpage
    1037
  • Lastpage
    1040
  • Abstract
    An assessment method for Step-down-stress accelerated life test data based on Bayesian theory is proposed in this paper. For the problem of the limited test information gained in the small sample life test, the assessment result is may not accurate enough. In this paper, we assume a certain prior distribution, according to prior information. Then, establish the posterior distribution combined with the accelerate life test data. Finally calculate the parameters of the accelerated model and life distribution. The simulation case verifies the effectiveness of the proposed approach.
  • Keywords
    "Life estimation","Stress","Reliability","Silicon","Data models","Maximum likelihood estimation","Bayes methods"
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management (IEEM), 2015 IEEE International Conference on
  • Type

    conf

  • DOI
    10.1109/IEEM.2015.7385806
  • Filename
    7385806