The processing method of temperature drift data for prediction based on wavelet theory

To solve the problem in the temperature drift data processing of photoelectric products based on temperature modeling compensation method, a new temperature drift data processing method is proposed. This method can analyze the data in different frequency with the wavelet theory, and then process the data and reject the temperature influence. The degradation data is taken as a research example, then the method is described minutely and the simulation method is used to verify its effectiveness. The research indicates the proposed method in this paper is useful to the photoelectric products´ temperature drift data process, and is helpful to improve its reliability evaluation accuracy.