Title :
A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS
Author :
Bertrand Parvais;Piet Wambacq;Abdelkarim Mercha;Diederik Verkest;Aaron Thean;Ken Sawada;Kazuki Nomoto;Tetsuya Oishi;Hiroaki Ammo
Author_Institution :
imec, Kapeldreef 75, B-3001 Leuven, Belgium
Abstract :
A test monitor circuit for low-frequency noise characterization is demonstrated in 28nm CMOS technology. The circuit allows a fast evaluation of the low frequency noise performance of transistors, providing a digital output. The VCO-based quantizer used for analog to digital conversion is capable of converting signal of small amplitude, in the μV range. A good agreement between the results obtained with the proposed circuit and standard measurements techniques is obtained.
Keywords :
"Voltage-controlled oscillators","Monitoring","Low-frequency noise","CMOS integrated circuits","Preamplifiers","Frequency modulation"
Conference_Titel :
Solid-State Circuits Conference (A-SSCC), 2015 IEEE Asian
DOI :
10.1109/ASSCC.2015.7387446