DocumentCode
3734578
Title
About the functional test of permanent faults in distributed systems
Author
A. Vaskova;M. Portela-Garc?a;C. L?pez-Ongil;E. S?nchez;M. Sonza Reorda
Author_Institution
Electronic Technology Department, Carlos III University of Madrid, Legan?s, Spain
fYear
2015
Firstpage
1
Lastpage
6
Abstract
The effects of permanent faults, arising along working life of digital electronic systems, may impact their reliability and performance. In-field test may help to detect these faults and to prevent serious effects in safety-critical applications. Distributed electronic systems introduce further complexity in this scenario, as the low observability and the lack of maintenance make difficult the detection as well as the identification of failing elements and their repairing. Functional workloads are often used for on-line tests of distributed systems to detect permanent faults. Suitable techniques for test generation and early identification of functionally untestable permanent faults are critical issues that are faced in this work.
Keywords
"Circuit faults","Fault diagnosis","Solid modeling","Testing","Hardware","Clocks"
Publisher
ieee
Conference_Titel
Design of Circuits and Integrated Systems (DCIS), 2015 Conference on
Type
conf
DOI
10.1109/DCIS.2015.7388571
Filename
7388571
Link To Document