• DocumentCode
    3734652
  • Title

    Modeling and characterization of Cu-graphene heterogeneous interconnects

  • Author

    Da-Wei Wang;Rui Zhang;Wen-Yan Yin;Wen-Sheng Zhao;Gaofeng Wang

  • Author_Institution
    Center for Optical and Electromagnetic Research, Zhejiang University, Hangzhou 310058, China
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    499
  • Lastpage
    502
  • Abstract
    In order to exploit graphene materials efficiently, some researcher have proposed Cu-graphene heterogeneous interconnects. In this study, an equivalent circuit model of such novel interconnect is presented, with the interfacial resistance treated appropriately. Then, the electrothermal characterization is carried out based on our self-developed TD-FEM algorithm. It is found that Cu-graphene heterogeneous interconnects could provide superior performance and reliability over the conventional Cu wires.
  • Keywords
    "Integrated circuit interconnections","Graphene","Wires","Integrated circuit modeling","Conductivity","Electrostatic discharges","Yttrium"
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO) , 2015 IEEE 15th International Conference on
  • Type

    conf

  • DOI
    10.1109/NANO.2015.7388648
  • Filename
    7388648