• DocumentCode
    3734696
  • Title

    Tunneling: The major issue in ultra-scaled MOSFETs

  • Author

    Mehdi Salmani Jelodar;Hesameddin Ilatikhameneh;Prasad Sarangapani;Saumitra R. Mehrotra;Gerhard Klimeck;SungGuen Kim;Kwok Ng

  • Author_Institution
    Network for Computational Nanotechnology, School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    670
  • Lastpage
    673
  • Abstract
    As transistors scale below 10 nm, the numbers of atoms and electrons are countable in the critical device areas. At this scale, quantum mechanical phenomena start playing an important role in the performance of the transistors. One of the major quantum mechanical effects is tunneling; i.e. tunneling between the gate and channel due to the reduction of physical oxide layer thickness and direct tunneling between the source and drain due to scaling down of channel length. This paper discusses these tunneling issues on performance of ultra-scaled transistors based on rigorous atomistic simulations and provides some solutions for scaling based on a quantitative analysis.
  • Keywords
    "Tunneling","Logic gates","High K dielectric materials","Performance evaluation","Leakage currents","MOSFET"
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO) , 2015 IEEE 15th International Conference on
  • Type

    conf

  • DOI
    10.1109/NANO.2015.7388694
  • Filename
    7388694