• DocumentCode
    3735245
  • Title

    Thermal-electronic circuits: Basics, simulations, experiments

  • Author

    J?nos Mizsei;M?rton C. Bein;Jyrki Lappalainen;L?szl? Juh?sz

  • Author_Institution
    Budapest University of Technology and Economics, Budapest, Hungary
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Semiconductor devices are sensitive on temperature, and they produce a lot of heat because of the high power density. Therefore thermal effects have high importance in the operation of the semiconductor based microsystems. The thermal management has key importance in the microsystem construction, however thermal effects has been treated as parasitic phenomena until now. Recent research demonstrated that beside the electrical signal the thermal signal can also be treated as logic variable. In order to get closer to both the construction aspects and modeling questions of thermal-electronic devices lateral thin film semiconductor devices were constructed by laser ablation (vanadium dioxide, VO2) and cathode sputtering technology (Pt electrodes). The high temperature sensitivity of semiconductor-metal transition (SMT) semiconductor resulted in promising switching characteristics. A model was constructed and thermal-electric simulations were performed; the results are in good correlation with the measurements validating both the model and the explanation of the behavior.
  • Keywords
    "Thermal resistance","Resistors","Heating","Switches","Logic gates","Conductivity"
  • Publisher
    ieee
  • Conference_Titel
    Thermal Investigations of ICs and Systems (THERMINIC), 2015 21st International Workshop on
  • Type

    conf

  • DOI
    10.1109/THERMINIC.2015.7389599
  • Filename
    7389599