DocumentCode :
3735287
Title :
Towards a quantitative methodology for measuring micro and nanoscale transition properties for heat transfer modelling in thermal devices and materials
Author :
Angela Dawson;Antony S. Maxwell
Author_Institution :
National Physical Laboratory, London, UK
fYear :
2015
Firstpage :
1
Lastpage :
6
Abstract :
A first uncertainty budget for Scanning Thermal Microscopy (SThM) is developed because quantitative data is needed to accurately model heat transfer behaviour of polymers and polymeric components. Applications include the design of thermal devices and materials such as Thermal Interface Materials (TIM). Thermomechanical tests provide melting point and glass transition temperature values. This requires micro and nanoscale thermal measurements using SThM, but remains a highly qualitative approach. Understanding the uncertainties involved when making a measurement provides the only route to producing quantitative rather than qualitative results. A review to identify test parameters, physical properties and measurands for SThM is described. Uncertainties for these terms and methodologies for measurement of uncertainties are identified based on preliminary information. Novel uncertainty analyses are presented for SThM measurement systems and measurands. Developing a fully quantified SThM measurement technique is key to the success of this work, and will be the focus of future work.
Keywords :
"Uncertainty","Measurement uncertainty","Probes","Standards","Heating","Temperature measurement","Pollution measurement"
Publisher :
ieee
Conference_Titel :
Thermal Investigations of ICs and Systems (THERMINIC), 2015 21st International Workshop on
Type :
conf
DOI :
10.1109/THERMINIC.2015.7389642
Filename :
7389642
Link To Document :
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