DocumentCode
3735697
Title
Solder paste residue corrosivity assessment: Bono test
Author
C?line Puechagut;Anne-Marie La?gt;Emmanuelle Gu?n?;Richard Anisko
Author_Institution
Inventec Performance Chemicals, Bry Sur Marne, France
fYear
2015
Firstpage
1
Lastpage
7
Abstract
Lead free soldering with no clean solder pastes represent nowadays the most common process in electronic assembly. A solder paste is usually considered as no-clean if it passes all IPC J-STD-004 corrosion tests: copper mirror, copper panel corrosion test, Surface Insulation Resistance (SIR) and Elecrochemical Migration (ECM). Other SIR and ECM tests are described in Bellcore GR-78-CORE and JIS Z3197 standards. Although SIR and ECM tests are recognized by all standards authorities to evaluate the solder paste residue corrosivity after reflow, a more selective method, the Bono test, has been developed and implemented in some French companies as a qualification criterion. It has been proven that compared to common corrosion tests, the Bono test better differentiates the nature of solder paste residues.
Keywords
"Corrosion","Electronic countermeasures","Coatings","Copper","Nitrogen","Europe","Microelectronics"
Publisher
ieee
Conference_Titel
Microelectronics Packaging Conference (EMPC), 2015 European
Type
conf
Filename
7390720
Link To Document