• DocumentCode
    3738581
  • Title

    Psychological stress measurement using low cost single channel EEG headset

  • Author

    Sanay Muhammad Umar Saeed;Syed Muhammad Anwar;Muhammad Majid;Adnan Mehmood Bhatti

  • Author_Institution
    Department of Computer Engineering, University of Engineering and Technology, Taxila, Pakistan
  • fYear
    2015
  • Firstpage
    581
  • Lastpage
    585
  • Abstract
    This paper present, results of the study on noninvasive stress measurement using EEG signals recorded with a single electrode device. The process involves EEG data acquisition, feature extraction, and stress level classification. Psychologists have developed over a period of time, questionnaires that cover a wide range of symptoms associated with stress. In the first step, stress level of each participant was assessed using the Perceived Stress Scale (PSS) questionnaire. EEG signals of twenty eight participants were recorded using a single channel EEG headset for duration of three minutes. Feature vector based on frequency sub bands is used to train three different machine learning algorithms, to classify the stress level of participants. It is evident from results that psychological stress level can be measured by single channel EEG headset using machine learning algorithms with considerable accuracy. Moreover, increased Beta activity of subjects with high stress has been observed as compared to the subjects with no stress. This fact can be used as a key factor in classifying psychological stress with single channel EEG headset.
  • Keywords
    "Stress","Electroencephalography","Support vector machines","Classification algorithms","Stress measurement","Headphones","Psychology"
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing and Information Technology (ISSPIT), 2015 IEEE International Symposium on
  • Type

    conf

  • DOI
    10.1109/ISSPIT.2015.7394404
  • Filename
    7394404