Discrepancies in real time Jitter Measurements pertaining to on-board irregularities

Characterizing a standalone design is normally hindered by various irregularities such as Reflections, crosstalk, EMI etc that the signal is vulnerable to pass through on the test board fixture. Many publications pointed out the effects of various board components on the jitter measurements like TIE, Period Jitter, etc whose results are driving the world-wide standards for the acceptability of the design in this highly competitive market but the reason of these deviations in the measurements have not been deeply analyzed. This paper provides an analytical approach to the cause of Jitter variation on characterizing board, using simulations. Some real time Jitter Measurements on high speed test board are provided as a proof to support its claim.