Title :
Discovering Anomalies and Root Causes in Applications via Relevant Fields Analysis
Author :
Yuchen Zhao;Arjun Iyer;Ariel Smoliar
Abstract :
In this paper, we present a powerful end-to-end data mining system that collects application related data and provides insightful relevant fields analysis in addition to search and filtering. We present details on field extraction, indexing, relevant field processing and dynamic baseline derivation. We also propose to demonstrate the effectiveness of various scoring algorithms. Two real-world use cases show relevant fields analysis is effective to detect application anomalies and discover root causes of application incidents.
Keywords :
"Business","Data mining","Indexing","Monitoring","Heuristic algorithms","User interfaces","Software"
Conference_Titel :
Data Mining Workshop (ICDMW), 2015 IEEE International Conference on
Electronic_ISBN :
2375-9259
DOI :
10.1109/ICDMW.2015.68