• DocumentCode
    3739369
  • Title

    Discovering Anomalies and Root Causes in Applications via Relevant Fields Analysis

  • Author

    Yuchen Zhao;Arjun Iyer;Ariel Smoliar

  • fYear
    2015
  • Firstpage
    1664
  • Lastpage
    1667
  • Abstract
    In this paper, we present a powerful end-to-end data mining system that collects application related data and provides insightful relevant fields analysis in addition to search and filtering. We present details on field extraction, indexing, relevant field processing and dynamic baseline derivation. We also propose to demonstrate the effectiveness of various scoring algorithms. Two real-world use cases show relevant fields analysis is effective to detect application anomalies and discover root causes of application incidents.
  • Keywords
    "Business","Data mining","Indexing","Monitoring","Heuristic algorithms","User interfaces","Software"
  • Publisher
    ieee
  • Conference_Titel
    Data Mining Workshop (ICDMW), 2015 IEEE International Conference on
  • Electronic_ISBN
    2375-9259
  • Type

    conf

  • DOI
    10.1109/ICDMW.2015.68
  • Filename
    7395883