• DocumentCode
    37400
  • Title

    Absorption Modulation of Plasmon Resonant Nanoparticles in the Presence of an AFM Tip

  • Author

    Huda, G.M. ; Hastings, J.T.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Kentucky, Lexington, KY, USA
  • Volume
    19
  • Issue
    3
  • fYear
    2013
  • fDate
    May-June 2013
  • Firstpage
    4602306
  • Lastpage
    4602306
  • Abstract
    We numerically calculated the optical absorption cross section (Cabs) of a silver nanoparticle (AgNP) and a gold nanoparticle (AuNP) in the presence of metallic (gold) and dielectric (silicon) atomic force microscope (AFM) probes, illuminated by transverse magnetic polarized, total internally reflected waves. Both nanoscale probes localize and enhance the field between the apex of the tip and the particle. However, the absorption of the nanoparticle is not always enhanced. Fitting the numerical absorption data to a driven damped harmonic oscillator model revealed that the AFM tip modifies both the driving force (F0), consisting of the free carrier charge and the driving field, and the overall damping of the oscillator (β). These effects can be complementary or competing, and they combine to either enhance or suppress absorption. Therefore, under an Si tip, Cabs of a AuNP is enhanced while Cabs of a AgNP is suppressed. In contrast, an Au tip suppresses the absorption cross section for both Au and Ag NPs.
  • Keywords
    atomic force microscopy; gold; light absorption; nanoparticles; nanophotonics; silver; surface plasmon resonance; AFM probes; AFM tip; Ag; Au; absorption modulation; atomic force microscope probes; dielectric silicon; driven damped harmonic oscillator model; driving field; driving force; free carrier charge; gold nanoparticle; metallic gold; nanoscale probes; numerical absorption data; optical absorption cross section; plasmon resonant nanoparticles; silver nanoparticle; transverse magnetic polarized total internally reflected waves; Absorption; Damping; Force; Gold; Nanoparticles; Silicon; Substrates; Absorption; atomic force microscopy; finite element methods; nanoparticles;
  • fLanguage
    English
  • Journal_Title
    Selected Topics in Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    1077-260X
  • Type

    jour

  • DOI
    10.1109/JSTQE.2013.2244562
  • Filename
    6425396