• DocumentCode
    3741782
  • Title

    A very high bit rate test platform for ISO 14443 and interoperability tests

  • Author

    Benoit Couraud;Remy Vauche;Thibaut Deleruyelle;Edith Kussener

  • Author_Institution
    ISEN-Toulon, France
  • fYear
    2015
  • Firstpage
    353
  • Lastpage
    356
  • Abstract
    This paper presents a new test platform that aims to test new generations of Near Field Communication (NFC) products implementing Very High Bit Rate (VHBR), up to 6.78Mb/s. New generations of NFC products, and especially electronic passports, will implement new data rates above 848kb/s in order to facilitate data exchange and increase security. This increase in data rates up to 6.78Mb/sby modulating a carrier of13.56MHz is a real challenge and will push the existing technology to its limits. In order to assess the quality of these new products and ensure their interoperability, it is necessary to design a new test platform. This paper presents such a test platform that assesses NFC products compliancy with new amendments of ISO 14443 Standard. The presented solution consists in an FPGA based platform driving a Digital to Analog and an Analog to Digital converters, with an antenna and its matching network allowing good quality of signals at data rates up to 6.78Mb/s.
  • Keywords
    "Radio frequency","ISO","Assembly","Memory management","Field programmable gate arrays","Hardware"
  • Publisher
    ieee
  • Conference_Titel
    Communication Technology (ICCT), 2015 IEEE 16th International Conference on
  • Print_ISBN
    978-1-4673-7004-2
  • Type

    conf

  • DOI
    10.1109/ICCT.2015.7399857
  • Filename
    7399857