DocumentCode :
3741830
Title :
A high-frequency scalable model for thin-film resistor on GaN substrate
Author :
Yue Li; Zhennan Wei
Author_Institution :
School of Information Science and Engineering, Southeast University, Nanjing 211100, China
fYear :
2015
Firstpage :
589
Lastpage :
592
Abstract :
A new approach to parameter extraction for equivalent circuit model of resistors for RF applications is proposed in this paper. The parameters of the model can be extracted with high precision and more efficiently than the current method of parameter sweep by EDA tools, especially over a wide frequency range. The model based on this approach is in close agreement with the testing results of the resistor over a frequency range of 0.1-40 GHz.
Keywords :
"Frequency measurement","Gallium nitride","Substrates","Radio frequency"
Publisher :
ieee
Conference_Titel :
Communication Technology (ICCT), 2015 IEEE 16th International Conference on
Print_ISBN :
978-1-4673-7004-2
Type :
conf
DOI :
10.1109/ICCT.2015.7399907
Filename :
7399907
Link To Document :
بازگشت