DocumentCode :
3741878
Title :
FSM dual logic synthesis targeting area optimization
Author :
Weijian Lin;Lunyao Wang;Yinshui Xia
Author_Institution :
Faculty of Electrical Engineering and Computer Science, Ningbo University, 315211, China
fYear :
2015
Firstpage :
821
Lastpage :
826
Abstract :
To cope with the problem that exiting in the area optimization of the finite state machine(FSM) by only using traditional Boolean logic operations, a novel algorithm for FSM area optimization using both traditional Boolean logic and Reed-Muller logic, namely dual logic, is proposed. By introducing the majority cover of a logic function, and defining the coefficient of the majority cover and the remainder of the majority cover, a cost function of the FSM area is presented which helps the genetic algorithm to finish state assignment for the FSM dual logic synthesis. The proposed algorithm has been implemented in C and tested under the MCNC benchmarks. The experimental results show that for most 76% test cases, the proposed dual logic optimization algorithm can reduce FSM area further in contrast to the method which only employs traditional Boolean logic.
Keywords :
"Logic gates","Manganese","Benchmark testing","Optimized production technology"
Publisher :
ieee
Conference_Titel :
Communication Technology (ICCT), 2015 IEEE 16th International Conference on
Print_ISBN :
978-1-4673-7004-2
Type :
conf
DOI :
10.1109/ICCT.2015.7399955
Filename :
7399955
Link To Document :
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