DocumentCode :
3744631
Title :
Image quality analysis for a multiple overlapping field of view Serial Laser Imager
Author :
Nicholas Rasoletti;Fraser Dalgleish;Bing Ouyang;Anni Vuorenkoski;Pierre-Philippe Beaujean
Author_Institution :
Department of Ocean and Mechanical Engineering, Center for Acoustics and Vibrations, Florida Atlantic University, Seatech, 101 N. Beach Road, Dania Beach, 33004, USA
fYear :
2015
Firstpage :
1
Lastpage :
9
Abstract :
The Combined Laser and Scan Sonar (CLASS) system is an extended range imaging system, incorporating both high-resolution laser images and high frequency sonar images. Both the laser and sonar images are collected simultaneously during testing to provide dual mode imagery of an underwater target, displaying both a 2D image of the target (laser image) and a 3D overlay of the target (sonar image). The laser component of the system is a Multiple Overlapping Field of view Serial Laser Imager (MOFSLI), capable of generating high-resolution sub-centimeter 2D images. MOFSLI generates the images by way of a diffraction-limited 532nm continuous wave (CW) laser beam being scanned over the target. Initial field tests resulted in highquality images of the ocean floor. However, there was a clear need for further study and improvement. The first step is to carefully evaluate the quality of the images generated by MOFSLI. To do so, a calibration and performance evaluation of MOFSLI was executed in the specialized underwater electrooptics testing facility located in the Ocean Visibility and Optics laboratory at Harbor Branch Oceanographic Institute(HBOI), focusing on the effects of increased scattering levels.
Keywords :
"Testing","Receivers","Oceans","Calibration","Optical imaging","Optical scattering"
Publisher :
ieee
Conference_Titel :
OCEANS´15 MTS/IEEE Washington
Type :
conf
Filename :
7404575
Link To Document :
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