• DocumentCode
    3746106
  • Title

    A digital background calibration technique for split DAC based SAR ADC by using redundant cycle

  • Author

    Wuguang Wang;Rulin Huang;Guoquan Sun;Weijun Mao;Xiaolei Zhu

  • Author_Institution
    Institute of VLSI Design, Zhejiang University, 310027 Hangzhou, P. R. China
  • fYear
    2015
  • Firstpage
    231
  • Lastpage
    234
  • Abstract
    A digital background calibration technique for split CDAC mismatch is proposed. It uses the dummy capacitor to generate an extra calibration bit. The mismatch of the CDAC array is detected by the calibration bit and fed back to the compensation capacitor. A 9b 100MS/s SAR ADC is demonstrated in standard 65nm CMOS technology. Simulation results show that the DNL and INL can be decreased to ±0.1 LSB and +0.11/-0.13 LSB, respectively, after using this technique. The proposed calibration block consumes only 50μw from a 1.2V supply.
  • Keywords
    Hafnium
  • Publisher
    ieee
  • Conference_Titel
    System-on-Chip Conference (SOCC), 2015 28th IEEE International
  • Electronic_ISBN
    2164-1706
  • Type

    conf

  • DOI
    10.1109/SOCC.2015.7406952
  • Filename
    7406952