DocumentCode :
3746106
Title :
A digital background calibration technique for split DAC based SAR ADC by using redundant cycle
Author :
Wuguang Wang;Rulin Huang;Guoquan Sun;Weijun Mao;Xiaolei Zhu
Author_Institution :
Institute of VLSI Design, Zhejiang University, 310027 Hangzhou, P. R. China
fYear :
2015
Firstpage :
231
Lastpage :
234
Abstract :
A digital background calibration technique for split CDAC mismatch is proposed. It uses the dummy capacitor to generate an extra calibration bit. The mismatch of the CDAC array is detected by the calibration bit and fed back to the compensation capacitor. A 9b 100MS/s SAR ADC is demonstrated in standard 65nm CMOS technology. Simulation results show that the DNL and INL can be decreased to ±0.1 LSB and +0.11/-0.13 LSB, respectively, after using this technique. The proposed calibration block consumes only 50μw from a 1.2V supply.
Keywords :
Hafnium
Publisher :
ieee
Conference_Titel :
System-on-Chip Conference (SOCC), 2015 28th IEEE International
Electronic_ISBN :
2164-1706
Type :
conf
DOI :
10.1109/SOCC.2015.7406952
Filename :
7406952
Link To Document :
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