Theoretical analysis of free-ion yield in liquid Argon under low-let irradiation

A model using the FACSIMILE code is developed in this study to investigate the evolution of free-ion yield in liquid argon under low-LET electron irradiation. The field enhancement of free-ion yield in liquid argon and the concomitant reduction of radiation-induced luminescence implies an escape probability from recombination ~0.35 at very low external fields. This, when interpreted using Onsager´s equation, gives an electron thermalization length ~200 nm which is larger than the inter-positive ion separation on the track.