DocumentCode
3748076
Title
Novel fast-switching and high-data retention phase-change memory based on new Ga-Sb-Ge material
Author
H. Y. Cheng;W. C. Chien;M. BrightSky;Y. H. Ho;Y. Zhu;A. Ray;R. Bruce;W. Kim;C. W. Yeh;H. L. Lung;C. Lam
Author_Institution
IBM/Macronix PCRAM Joint Project, Macronix International Co., Ltd., Emerging Central Lab., 16 Li-Hsin Rd., Science Park, Hsinchu, Taiwan, ROC
fYear
2015
Abstract
Attempts to improve the retention so far must sacrifice switching speed. This work explores new phase change material based on pseudobinary GaSb-Ge system. The resulting new phase-change material has demonstrated fast switching speed of 80 ns, long endurance of 1G cycles and excellent data retention that survives 250°C-300 hrs. The 10 years-220°C data retention is the best ever reported. It is also the fastest material that can pass the solder bonding criteria for embedded automotive applications.
Keywords
"Phase change materials","Resistance","Optical switches","Bonding","Crystallization","Thermal stability"
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 2015 IEEE International
Electronic_ISBN
2156-017X
Type
conf
DOI
10.1109/IEDM.2015.7409620
Filename
7409620
Link To Document