Title :
Novel fast-switching and high-data retention phase-change memory based on new Ga-Sb-Ge material
Author :
H. Y. Cheng;W. C. Chien;M. BrightSky;Y. H. Ho;Y. Zhu;A. Ray;R. Bruce;W. Kim;C. W. Yeh;H. L. Lung;C. Lam
Author_Institution :
IBM/Macronix PCRAM Joint Project, Macronix International Co., Ltd., Emerging Central Lab., 16 Li-Hsin Rd., Science Park, Hsinchu, Taiwan, ROC
Abstract :
Attempts to improve the retention so far must sacrifice switching speed. This work explores new phase change material based on pseudobinary GaSb-Ge system. The resulting new phase-change material has demonstrated fast switching speed of 80 ns, long endurance of 1G cycles and excellent data retention that survives 250°C-300 hrs. The 10 years-220°C data retention is the best ever reported. It is also the fastest material that can pass the solder bonding criteria for embedded automotive applications.
Keywords :
"Phase change materials","Resistance","Optical switches","Bonding","Crystallization","Thermal stability"
Conference_Titel :
Electron Devices Meeting (IEDM), 2015 IEEE International
Electronic_ISBN :
2156-017X
DOI :
10.1109/IEDM.2015.7409620